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Thin Film Characterization

Thin film plays an important role in the development and study of material with new and unique properties. Holmarc provides equipments for characterization and study of thin films using various methods. The equipments listed in this section are useful for research as well as for post graduate education.


Holmarc's Spectrophotometer is ideal for education, research and industrial applications. Unlike other entry level spectrophotometers ...

Variable Angle Laser Ellipsometer

The Variable Angle Laser Ellipsometer is designed to meet the requirements of modern research and studies. Ellipsometry is a very sensitive measurement ...

Variable Angle Spectroscopic Ellipsometer

Spectroscopic ellipsometer is widely used for thin film analysis and measurements. Holmarc’s spectroscopic ellipsometer incorporates ...

Thin film Spectroscopic Reflectometer

Thin Film Spectroscopic Reflectometer is a fundamental instrument used for the analysis of thin film thickness in industry and research.

Theta 2 Theta Advanced Spectrophotometer

The need for reliable measurement techniques for optical characterisation of thin films is growing. HOLMARC’s Theta 2 Theta Spectrophotometer is ...

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