Thin Film Spectroscopic Reflectometer is a fundamental instrument used for the analysis of thin film thickness in industry and research. Holmarc’s TFSR Model No: HO-ED-TH- 04 is able to analyze thin film’s thickness, complex refractive index and surface roughness with high speed and repeatability. TFSR theory works with complex matrix form of Fresnel equations for reflectance and transmittance. Absolute reflectance spectroscopy is the principle behind Reflectometer; which is the ratio of the intensity of the reflected light beam (usually monochromatic) to the intensity of the incident beam.
Light beam normally incident on the sample surface in turn reflect from top and bottom of the thin film surfaces which get interfered and is directed through optical fiber to CCD attached spectrometer via computer. On the monitor we get spectrogram with interference oscillations directly proportional to the thin film thickness.
Holmarc’s Reflectometer can be used to analyze single, multi-layer, free standing and rough layer thickness of various stacks such as di-electric, crystalline, amorphous, metallic and absorbing samples. It also finds absolute transmittance and absorption directly. Roughness treatment is done with EMA modeling. The instrument can also be used to find optical conductivity, molar refractivity and Brewster’s angle of sample under study.