Light beam normally incident on the sample surface in turn reflect from top and bottom of the thin film surfaces which get interfered and is directed through optical fiber to CCD attached spectrometer via computer. On the monitor we get spectrogram with interference oscillations directly proportional to the thin film thickness.

Holmarc’s Reflectometer can be used to analyze single, multi-layer, free standing and rough layer thickness of various stacks such as di-electric, crystalline, amorphous, metallic and absorbing samples. It also finds absolute transmittance and absorption directly. Roughness treatment is done with EMA modeling. The instrument can also be used to find optical conductivity, molar refractivity and Brewster’s angle of sample under study.