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Diffuse Reflectance

Spectrophotometer

Model : HO-SP-DRSP100
Non-destructive technique
Both solid & liquid sample analysis

Diffuse reflectance spectrophotometer is designed for studying the spectral characteristics of opaque solid samples, Liquid, solids and thin film samples. Diffused reflectance measurement is based on the principle that not only does light reflected from the material come from the surface (specular reflection) but some is reflected internally (diffuse reflectance). Diffuse reflectance spectroscopy is most readily applicable to powders, any sample that scatters radiation can be characterized using this technique. While spectrophotometer setup in the instrument that measures the amount of light intensity absorbed after it passes through sample.

Multi-angle spectral photometric measurements / Absolute variable angle reflectance and transmission accessory can be provided on request. Model : HO-SP-DRSP100 provides researchers with more experimental information than conventional spectroscopy.

    Wavelength Range :     380 to 1100 nm
    Resolution :     1 nm
    Accuracy :     ± 1 nm
    Spectral bandwidth :     2 nm
    Transmittance
        Range :     0 to 100 %
        Resolution :     0.1 %
        Accuracy :     ± 1 %
        Noise Level :     < 1 %
        Stability :     1% / Hr after warm-up
    Absorbance
        Range :     0 to 2 A
        Resolution :     0.001 A
    Concentration
        Range :     0 to 999
        Selectable resolution 1, 0.1, 0.01 or 0.001
        Calibration with 1 or 2 known standards
        Direct factor entry
        10 method memory
    Integrating Sphere Attachment size :     100 mm
    Coating :     Barium Sulphate (BaS04)
    Angle of incident light :     0°
    Wavelength range :     200 to 1100 nm
    Maximum size of sample :     25 mm Dia
    Detector :     Si Photodiode
    Active Area :     5.8 x 5.8 mm
    Light Source :     50W Quartz Halogen Lamp
    PC Interface :     RS232 - USB
    Input Voltage :     230V 50Hz


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