Diffuse reflectance spectrophotometer is designed for studying the spectral characteristics of opaque solid samples, Liquid, solids and thin film samples. Diffused reflectance measurement is based on the principle that not only does light reflected from the material come from the surface (specular reflection) but some is reflected internally (diffuse reflectance). Diffuse reflectance spectroscopy is most readily applicable to powders, any sample that scatters radiation can be characterized using this technique. While spectrophotometer setup in the instrument that measures the amount of light intensity absorbed after it passes through sample.
Multi-angle spectral photometric measurements / Absolute variable angle reflectance and transmission accessory can be provided on request. Model : HO-SP-DRSP100 provides researchers with more experimental information than conventional spectroscopy.
Wavelength Range | : | 380 to 1100 nm |
Resolution | : | 1 nm |
Accuracy | : | ± 1 nm |
Spectral bandwidth | : | 2 nm |
Transmittance | ||
Range | : | 0 to 100 % |
Resolution | : | 0.1 % |
Accuracy | : | ± 1 % |
Noise Level | : | < 1 % |
Stability | : | 1% / Hr after warm-up |
Absorbance | ||
Range | : | 0 to 2 A |
Resolution | : | 0.001 A |
Concentration | ||
Range | : | 0 to 999 |
Selectable resolution 1, 0.1, 0.01 or 0.001 | ||
Calibration with 1 or 2 known standards | ||
Direct factor entry | ||
10 method memory | ||
Integrating Sphere Attachment size | : | 100 mm |
Coating | : | Barium Sulphate (BaS04) |
Angle of incident light | : | 0° |
Maximum size of sample | : | 25 mm Dia |
Detector | : | Si Photodiode |
Active Area | : | 5.8 x 5.8 mm |
Light Source | : | 50W Quartz Halogen Lamp |
PC Interface | : | RS232 - USB |
Input Voltage | : | 230V 50Hz |
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