Holmarc has introduced a new innovative high sensitivity and high magnetic field Spectroscopic ellipsometric measuring equipment utilizing the VIS-NIR wavelengths. HOLMARC A216 test station provides standardized testing solution to fit wide ranging optical rotation measurement applications. The modular hardware design allows user to take automatic liquid, solid and thin film sample measurements under magnetic and no magnetic field.
Designed for magneto optic material research and testing including magnetic characterizations of ferromagnetic and ferrimagnetic films and materials. Measurement include magnetic hysteresis loops of ultrathin magnetic films and multilayers, Ellipticity measurements, Thin film thickness measurement of dielectric materials, Refractive index, Delta and psi measurements etc. System can be operated in Polar, Longitudinal and Transverse configurations.
Instrument is designed for measurement in the wavelength range of 380nm to 845nm using a high sensitive photo multiplier tube made by hamamatsu. It is an extremely flexible test station based on HARS. Any magnetic thin film, crystal or solutions having magnetic field dependancy can be measured.
It can be used to measure magnetic properties of magnetic thin films and nano-magnet arrays. Thin film thickness measurements under uniform magnetic field applied to the sample provides user to characterize each class of materials.
Light source | : | Spectra Halogen, Deuterium / Halogen or Xenon Arc Lamp |
Monochromator | : | Quasar 300F Czerny-Turner Type |
Wavelength Range | : | 350 - 900 nm |
Collimating & Focusing mirror | : | 50 mm dia, 300 F |
Optical Grating | : | 1200 l / mm |
Spectral dispersion | : | 2.6 nm / mm |
Grating Size | : | 50 x 50 mm |
Absolute Diffraction Efficiency | : | 45 - 65 % |
Slit Width | : | 0 ~ 3 mm Continuously Adjustable |
Resolution | : | 0.1 nm |
Wavelength Accuracy | : | 0.2 nm |
Wavelength Repeatability | : | 0.1 nm |
Stray Light | : | 10-3 |
Reciprocal of Linear Dispersion | : | 2.7 mm |
Half-Width of Spectral line | : | 0.2 nm @ 586 nm |
Polarization analysis method | : | Rotation analyzing method |
ARMS | : | Stepper Motor Controlled Auto Positioning |
Spot Diameter | : | 1 - 5 mm |
Thin film Holder Sample size | : | 1 - 12 mm |
(Custom Holders can be provided on request) | ||
Cuvette | : | 10 mm Path length Quartz Cuvette |
Sample chamber option | : | High / low temperature sample holder |
Sample Feeding Unit | : | Stepper Motor Controlled Auto Positioning System |
Electro Magnet Unit | : | PC Controlled Constant current operation |
Cooling | : | Water cooled |
Max. magnetic field | : | 1.75 Tesla @ 12mm pole gap |
Min. Field Detection | : | 1 Gauss |
Magnetic field preciseness | : | ± 0.05 % |
Field detection | : | Hall probe based (PC based field measurement) |
Feed back of magnetic field | : | Hall element |
Chiller | : | 5 ~ 25°C Chilled water (for cooling electromagnet) |
Volume | : | 2 L / min. |
Power supply for Electro Magnet | : | Bi-Polar type (Max. ± 90 V/5A) |
Power supply for Electro Magnet | : | 2.5 kVA AC 220V 50Hz |
Control unit | : | 1 kVA AC 220V 50Hz |
Software | : | Spectra ORMS software |
350 - 900 nm Measurement Range
0.005 Degree Optical Rotation Resolution
Fully automatic control
Magnetic field detecting & feedback facility
MOKE Measurements
Ellipsometric Measurements
Optical Rotation Measurement Resolution : ± 0.009 Degree
Detecting sensitivity : 0.009 deg (at transparence more than 20 %).
Stability : 0.03 deg (at transparence more than 20 %).
Ellipticity Measurement : ± 0.01 deg.
Optical Rotation Measuring range : ± 90 deg.
Measuring Wavelength Range : 350 - 900 nm
Spectral Bandwidth : 1 nm ( Variable band pass up to 10nm)
Max. magnetic field : 17,500 Gauss
Min. Field Detection : 1 Gauss
Magnetic field preciseness : ± 0.05 %
OR Measurement of Thin film, crystal, fluids etc, having Faraday effect
Measurement Verdet Constant of Transparent Solids and Liquids
Faraday rotation / ellipticity angles
Polar Kerr rotation / ellipticity angles
Magnetic field vs. Faraday rotation angle property at a desired wavelength
Faraday rotation angle vs. Wavelength dispersion property
Faraday rotation angle vs. Thermal dependence property (Optional)
Optical Rotation
Film Thickness
Refractive Index
Absorption Coefficient
Optical Conductivity
Phase velocity
Group Index
Brewsters Angle
Refractivity in Air
Molar Refractivity
Photon Energy
Canonical Momentum
Kinetic Momentum
Group Velocity
PSI - Delta
Epsilon 1 & 2
Fig. Layer Selection Software Window
Fig. Material Library Software Window
The optical activity of transparent substance under an external electric field can also be investigated with addition of HV power supply on this unit.
Constant Value Model
Entered Value Model
Cauchy's Coefficients Model
Sellmeier's Coefficients Model
Combination of Cauchy & Sellmier Model
Drude Coefficients
Lorentz-Drude Coefficients
Brendel-Bormann Coefficients
Adachi Coefficients
Cauchy Lorentz Coefficients
Amorphous Dispersion Coefficients
Cauchy Absorption Coefficients
Sellmeier Lorentz Drude Model Coefficients
Cauchy Urbach Coefficients
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