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Magneto Optic Ellipsometry

Automated Thin film Test Station
(Magnetic Materials Characterization)
Model: HO-A216MOE-PH
Price : $ 45,000.00

Holmarc has introduced a new innovative high sensitivity and high magnetic field Spectroscopic ellipsometric measuring equipment utilizing the VIS-NIR wavelengths. HOLMARC A216 test station provides standardized testing solution to fit wide ranging optical rotation measurement applications. The modular hardware design allows user to take automatic liquid, solid and thin film sample measurements under magnetic and no magnetic field.

Designed for magneto optic material research and testing including magnetic characterizations of ferromagnetic and ferrimagnetic films and materials. Measurement include magnetic hysteresis loops of ultrathin magnetic films and multilayers, Ellipticity measurements, Thin film thickness measurement of dielectric materials, Refractive index, Delta and psi measurements etc. System can be operated in Polar, Longitudinal and Transverse configurations.

Instrument is designed for measurement in the wavelength range of 380nm to 845nm using a high sensitive photo multiplier tube made by hamamatsu. It is an extremely flexible test station based on HARS. Any magnetic thin film, crystal or solutions having magnetic field dependancy can be measured.

It can be used to measure magnetic properties of magnetic thin films and nano-magnet arrays. Thin film thickness measurements under uniform magnetic field applied to the sample provides user to characterize each class of materials.

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Performance

    Optical Rotation Measurement Resolution  :  ± 0.009 Degree
    Detecting sensitivity  :  0.009 deg (at transparence more than 20 %)
    Stability  :  0.03 deg (at transparence more than 20 %)
    Ellipticity Measurement  :  ± 0.01 deg.
    Optical Rotation Measuring range  :  ± 90 deg.
    Measuring Wavelength Range  :  350 - 900 nm
    Spectral Bandwidth  :  1 nm ( Variable band pass up to 10nm)
    Max. magnetic field  :  17,500 Gauss
    Min. Field Detection  :  1 Gauss
    Magnetic field preciseness  :  ± 0.05 %

Measuring items

    OR Measurement of Thin film, crystal, fluids etc, having Faraday effect
    Measurement Verdet Constant of Transparent Solids and Liquids
    Faraday rotation / ellipticity angles
    Polar Kerr rotation / ellipticity angles
    Magnetic field vs. Faraday rotation angle property at a desired wavelength
    Faraday rotation angle vs. Wavelength dispersion property
    Faraday rotation angle vs. Thermal dependence property (Optional)

Measuring Optical Properties

    Optical Rotation
    Film Thickness
    Refractive Index
    Absorption Coefficient
    Optical Conductivity
    Phase velocity
    Group Index
    Brewsters Angle
    Refractivity in Air
    Molar Refractivity
    Photon Energy
    Canonical Momentum
    Kinetic Momentum
    Group Velocity
    PSI - Delta
    Epsilon 1 & 2

Fig. Layer Selection Software Window

Fig. Material Library Software Window

The optical activity of transparent substance under an external electric field can also be investigated with addition of HV power supply on this unit.

Models used in the software

    Constant Value Model
    Entered Value Model
    Cauchy's Coefficients Model
    Sellmeier's Coefficients Model
    Combination of Cauchy & Sellmier Model
    Drude Coefficients
    Lorentz-Drude Coefficients
    Brendel-Bormann Coefficients
    Adachi Coefficients
    Cauchy Lorentz Coefficients
    Amorphous Dispersion Coefficients
    Cauchy Absorption Coefficients
    Sellmeier Lorentz Drude Model Coefficients
    Cauchy Urbach Coefficients
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Established in 1993, Holmarc Opto-Mechatronics Ltd manufactures variety of scientific and engineering instruments for research, industry and education.

ISO 9001:2015 Made in INDIA

Get in Touch

    B.7., H.M.T. Industrial Estate H.M.T. P.O, Kalamassery, Kochi Kerala, India - 683 503
   +91 920-719-7772 / 6 / 1
   sales@holmarc.com
   Mon - Sat : 9 am to 5 pm

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