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Magneto Optic Ellipsometry
Automated Thin film Test Station
(Magnetic Materials Characterization)
Model: HO-A216MOE-PH

Holmarc has introduced a new innovative high sensitivity and high magnetic field Spectroscopic ellipsometric measuring equipment utilizing the VIS-NIR wavelengths. HOLMARC A216 test station provides standardized testing solution to fit wide ranging optical rotation measurement applications. The modular hardware design allows user to take automatic liquid, solid and thin film sample measurements under magnetic and no magnetic field.

Designed for magneto optic material research and testing including magnetic characterizations of ferromagnetic and ferrimagnetic films and materials. Measurement include magnetic hysteresis loops of ultrathin magnetic films and multilayers, Ellipticity measurements, Thin film thickness measurement of dielectric materials, Refractive index, Delta and psi measurements etc. System can be operated in Polar, Longitudinal and Transverse configurations.

Instrument is designed for measurement in the wavelength range of 380nm to 845nm using a high sensitive photo multiplier tube made by hamamatsu. It is an extremely flexible test station based on HARS. Any magnetic thin film, crystal or solutions having magnetic field dependancy can be measured.

It can be used to measure magnetic properties of magnetic thin films and nano-magnet arrays. Thin film thickness measurements under uniform magnetic field applied to the sample provides user to characterize each class of materials.

    Light source :     Spectra Halogen, Deuterium / Halogen or Xenon Arc Lamp
    Monochromator :     Quasar 300F Czerny-Turner Type
    Wavelength Range :     350 - 900 nm
    Collimating & Focusing mirror :     50 mm dia, 300 F
    Optical Grating :     1200 l / mm
    Spectral dispersion :     2.6 nm / mm
    Grating Size :     50 x 50 mm
    Absolute Diffraction Efficiency :     45 - 65 %
    Slit Width :     0 ~ 3 mm Continuously Adjustable
    Resolution :     0.1 nm
    Wavelength Accuracy :     0.2 nm
    Wavelength Repeatability :     0.1 nm
    Stray Light :     10-3
    Reciprocal of Linear Dispersion :     2.7 mm
    Half-Width of Spectral line :     0.2 nm @ 586 nm
    Polarization analysis method :     Rotation analyzing method
    ARMS :     Stepper Motor Controlled Auto Positioning
    Spot Diameter :     1 - 5 mm
    Thin film Holder Sample size :     1 - 12 mm
        (Custom Holders can be provided on request)
    Cuvette :     10 mm Path length Quartz Cuvette
    Sample chamber option :     High / low temperature sample holder
    Sample Feeding Unit :     Stepper Motor Controlled Auto Positioning System
    Electro Magnet Unit :     PC Controlled Constant current operation
    Cooling :     Water cooled
    Max. magnetic field :     1.75 Tesla @ 12mm pole gap
    Min. Field Detection :     1 Gauss
    Magnetic field preciseness :     ± 0.05 %
    Field detection :     Hall probe based (PC based field measurement)
    Feed back of magnetic field :     Hall element
    Chiller :     5 ~ 25°C Chilled water (for cooling electromagnet)
    Volume :     2 L / min.
    Power supply for Electro Magnet :     Bi-Polar type (Max. ± 90 V/5A)
    Power supply for Electro Magnet :     2.5 kVA AC 220V 50Hz
    Control unit :     1 kVA AC 220V 50Hz
    Software :     Spectra ORMS software

    350 - 900 nm Measurement Range

    0.005 Degree Optical Rotation Resolution

    Fully automatic control

    Magnetic field detecting & feedback facility

    MOKE Measurements

    Ellipsometric Measurements


    Optical Rotation Measurement Resolution  :  ± 0.009 Degree

    Detecting sensitivity  :  0.009 deg (at transparence more than 20 %).

    Stability  :  0.03 deg (at transparence more than 20 %).

    Ellipticity Measurement  :  ± 0.01 deg.

    Optical Rotation Measuring range  :  ± 90 deg.

    Measuring Wavelength Range  :  350 - 900 nm

    Spectral Bandwidth  :  1 nm ( Variable band pass up to 10nm)

    Max. magnetic field  :  17,500 Gauss

    Min. Field Detection  :  1 Gauss

    Magnetic field preciseness  :  ± 0.05 %

Measuring items

    OR Measurement of Thin film, crystal, fluids etc, having Faraday effect

    Measurement Verdet Constant of Transparent Solids and Liquids

    Faraday rotation / ellipticity angles

    Polar Kerr rotation / ellipticity angles

    Magnetic field vs. Faraday rotation angle property at a desired wavelength

    Faraday rotation angle vs. Wavelength dispersion property

    Faraday rotation angle vs. Thermal dependence property (Optional)

Measuring Optical Properties

    Optical Rotation

    Film Thickness

    Refractive Index

    Absorption Coefficient

    Optical Conductivity

    Phase velocity

    Group Index

    Brewsters Angle

    Refractivity in Air

    Molar Refractivity

    Photon Energy

    Canonical Momentum

    Kinetic Momentum

    Group Velocity

    PSI - Delta

    Epsilon 1 & 2

Fig. Layer Selection Software Window

Fig. Material Library Software Window

The optical activity of transparent substance under an external electric field can also be investigated with addition of HV power supply on this unit.

Models used in the software

    Constant Value Model

    Entered Value Model

    Cauchy's Coefficients Model

    Sellmeier's Coefficients Model

    Combination of Cauchy & Sellmier Model

    Drude Coefficients

    Lorentz-Drude Coefficients

    Brendel-Bormann Coefficients

    Adachi Coefficients

    Cauchy Lorentz Coefficients

    Amorphous Dispersion Coefficients

    Cauchy Absorption Coefficients

    Sellmeier Lorentz Drude Model Coefficients

    Cauchy Urbach Coefficients

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