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Z-Scan system

Model : HO-ED-LOE-03

The Z-Scan technique is a simple and popular experimental technique used to measure intensity dependent nonlinear susceptibilities of materials. Holmarc's Z-Scan System is a simple implementation of the z-scan technique that can be used to characterize optical materials.

In this method, the sample is translated along the axis of a focused Gaussian beam, and the far field intensity is measured as a function of the sample position. Analysis of the intensity versus sample position, Z-Scan curve, predicated on a local response, gives the real and imaginary parts of the third order susceptibility. In this technique, the optical effects can be measured by translating a sample in and out of the focal region of an incident laser beam.

Holmarc's Z-Scan System includes precision motorized stage for linear scanning, photo diode assembly along with mechanical mounts and control electronics for motion control and data acquisition. High power 532 nm CW DPSS Laser is used as the light source. Parameters like travel distance, data acquisition intervals etc. can be programmed using computer Interface.



Experiment Examples

    To measure intensity dependent nonlinear susceptibilities of materials

The two measurable quantities connected with the z - scan are non linear absorption and non linear refraction. These parameters are associated with the imaginary and real part of the third order non linear susceptibility and provide important information about the properties of the material.





Features

    532nm CW DPSS Laser

    Photo detector with spectral response range of 320 - 1100nm

    Optical breadboard make the system flexible

    User - friendly software

    Live plot during scanning


Fig. Z - Scan theoretical curves of the transmittance as a function of Z

Related Topics

    Non linear absorption

    Non linear refraction

    Non linear susceptibility
Scope of Supply


    Optical Breadboard with Rigid Support

Model No: ED-LOE-03-BBRS
Dimensions
:
1200 x 800 mm
Material
:
5 mm thick magnetic SS top skin - 410 Grade
Holes
:
M6 tapped holes at 25 mm grid
Quantity
:
1 no.
Optical Breadboard with Rigid Support

    Laser Source with Mount

Model No: ED-LOE-03-DPSS
Type
:
DPSS Laser
Power
:
100 mW
Wavelength
:
532 nm
Power Stability
:
<5% (over 2 hours)
Beam Divergence
:
<1.5mrad
Beam Diameter
:
<1.2 mm
Warm-up time
:
< 15 min
Quantity
:
1 no.
Motorized Linear Translation Stage

    Motorized Linear Translation Stage

Model No: ED-LOE-03-MLTS
Actuator
:
Stepper motor
Drive Mechanism
:
Lead screw
Travel range offered
:
150 mm
Resolution
:
0.1 mm
PC connectivity
:
Serial port (RS 232)
Power input
:
230 V, 50 Hz
Quantity
:
1 no.
Cuvette Holder

    Photo Detector with Mount

Model No: ED-LOE-03-PDM
Type
:
Si Photodiode
Active area
:
5.8 mm x 5.8 mm
Range
:
320 - 1100 nm
Quantity
:
2 nos.
Variable Aperture with Mount

    Dual Channel Control Unit

Model No: ED-LOE-03-DCCU
Drive
:
Bipolar stepper motor drive
Current Control
:
PWM current control
Step
:
1 / 16 micro step
Control
:
Microprocessor controlled
Detector Interface
:
Dual channel detector interface
Operation
:
PC based operation
Connectivity
:
Serial port (RS232C)
Quantity
:
1 no. each
Beam Splitter Mount

    Kinematic Mirror Mount with Mirror

Model No: ED-LOE-03-KMM
Output Voltage
Material
:
Borofloat (Schott)
Coating
:
Protected Aluminium
Diameter
:
25 mm
Thickness
:
6 mm
Dimensional Tolerance
:
+/ -0.2 mm
Clear Aperture
:
90% of diameter
Surface Quality
:
40 - 20 (Scratch - dig)
Surface Flatness
:
λ/4 @ 632
Quantity
:
2 nos.
Kinematic Laser Mount

    Variable Beam Splitter with Mount

Model No: ED-LOE-03-VBSM
Diameter
:
75 mm
Thickness
:
3 mm
Material
:
H-K9L
Coating
:
S1 - Protective Aluminium
 
 
S2 - Anti-reflection Coating
Surface Quality
:
40 - 20 (scratch-dig)
Surface Flatness
:
λ/4 @ 632.8 nm
Mount Material
:
Aluminium
Quantity
:
1 no.
Plano Convex Lens with Mount

    Achromatic Lens with Mount

Model No: ED-LOE-03-ALM
Material
:
H-K9L
Design Wavelength
:
587.6 nm
Focal length
:
286 mm & 100 mm
Effective Focal Length Tolerance
:
± 1%
Surface Quality
:
40 - 20 (scratch-dig)
Clear Aperture
:
> 90% of Diameter
Quantity
:
1 no each.
ND Filter Wheel

    ND Filter Wheel

Model No: ED-LOE-03-NDFW
Filters
:
6 nos
Type
:
Absorptive
Optical Density
:
1, 2, 2.3, 3, 3.3 & 4
Material
:
NG4 & Ng9
Surface Quality
:
40 - 20 (scratch-dig)
Clear Aperture
:
90 %
Surface Flatness
:
λ/4 @ 632.8nm
Quantity
:
1 no.
Mirror with Cell

    Cuvette with Holder

Model No: ED-LOE-03-CH
Material
:
UV Fused silica
Path length
:
1 mm
Outer dimension
:
44.5 x 20 x 3 mm
Inner dimension
:
35 x 10 x 1 mm
Volume
:
0.35 mL approx.
Holder Material
:
Aluminium
Dimensions
:
50 x 25 x 5 mm
Quantity
:
1 no.
Beam Splitter

    Variable Aperture with Mount

Model No: ED-LOE-03-VAM
Material
:
Aluminium & Spring Steel
Max. Aperture
:
25 mm
Min. Aperture
:
2 mm
Quantity
:
1 no.
Photo Detector with Mount

    Aperture Wheel with Selectable Apertures

Model No: ED-LOE-03-AW
Material
:
Anodized Aluminium
Aperture Diameters
:
0.50 mm, 0.75 mm,
 
 
1.00 mm, 1.25 mm, 1.50 mm,
 
 
1.75 mm, 2 mm, 2.50 mm & 3 mm
Quantity
:
1 no.
Beam Splitter

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